Our highly qualified engineers are not only capable of servicing your equipment to a high standard, but can also perform any technical upgrades that you need.
Upgrades are an all-important part of keeping up with the latest developments at minimal costs without compromising quality. Scienta Omicron offers more than 40 upgrades, which greatly improve the efficiency and performance of a system, as well allowing you to achieve higher impact research results.
Exchange Your Old ISE10 Sputter Gun with a new FDG15 Sputter Source and Controller
Every successful story comes to an end! The ISE10 ion sputter source, which has been used by many customers for almost 20 years, is no exception. Since all spare parts are no longer available, we are no longer able to service all repair orders. Therefore, we are pleased to offer the FDG15 as a replacement for the ISE10 for a special price. The FDG15 is our recommended replacement for your ISE10 and the perfect solution for sample cleaning and basic depth profiling. Its Gaussian ion beam produces a variable spot size from 300 µm up to 10 mm. Differential pumping is possible, but not mandatory.
Exchange Your ISE10 Power Supply with an FDG15 Power Supply
Every successful story comes to an end! The ISE10 ion sputter source, which has been used by many customers for almost 20 years, is no exception. As many of the electronics parts of the ISE10 controllers (NGISE10) are outdated, we cannot longer offer to repair these units. For customers who are satisfied with their ISE10 source, but have issues with their power supply, we are pleased to offer the FDG15 power supply as a replacement for the NGISE10 for a special price. The existing ISE10 cable will be adapted to work with the new power supply. Later upgrade with FDG15 sputter source is possible.
High Performance Fine Focus Ion Source: A High Quality Upgrade for Sample Cleaning and Depth Profiling
The depth profiling upgrade integrates a high-quality focussed ion beam source seamlessly in your Scienta Omicron system. The hot filament ion source is a professional tool for sample cleaning, depth profiling with XPS or Auger electron spectroscopy. It can be used as a high-quality ion source for ISS/LEIS or as a low energy source for charge neutralisation.
Every upgrade includes a prior compatibility check by our Scienta Omicron system designers in Taunusstein and comes with suggestions for an individual system integration of the ion source.
E-Beam Heater Upgrade Package, High Temperature Version
Scienta Omicron manipulators can easily be upgraded with a high-temperature heater stage (HTHS) for radiative (RH) or e-beam (EBH) heating to let your system benefit from higher sample temperature achievable compared to a standard PBN or e-beam heater with thoriated filament. The set up allows for either radiative or e-beam heating, continuously, with identical temperature limits! Containing all required parts, the package comes pre-assembled for easy on-site implementation.
PEAK: Electron Spectroscopy Control and Acquisition Software
PEAK is designed to control acquisition of photoelectron spectra with Scienta Omicron analysers. With its modern software architecture, PEAK offers improved performance for data acquisition, workflow, and live visualisation of data. The modular design and the modern network-based application programming interface (API) facilitate integration of additional equipment as well as full integration of the analyser in external control systems.
SXM Trade In for SCALA SPM Controllers
The new SXM Control System comprises state-of-the-art electronics and software solutions for Scanning Probe Microscopy. The SXM hardware features low noise, large detection bandwidth, configurable A/D and D/A converters, integrated digital Lock In amplifiers. The SXM software offers standard SPM modes as well as advanced spectroscopy and manipulation experiments. A dedicated interface readily supports a variety of our established Scienta Omicron SPM products.
High Uptime Kit VT STM & LT STM
Having spare parts and consumables available in your lab is a great way of minimising downtime for your SPM instruments. To help support your research we have created the High Uptime Kits for our popular VT STM XA and LT STM instruments. These packages include the common consumables and spare parts needed to keep your experiments running in the event of a worn out part or misplaced component.
The High Uptime Kits come in VT STM XA and LT STM variations.
High Uptime Kit UHV Systems
A well maintained Ultra High Vacuum System is the underlying foundation for successful experiments. To help support our customers we have created High Uptime Kits for Scienta Omicron UHV Systems. These packages include the most common consumables and spare parts required for system maintenance or a rapid repair.
High Uptime Kit VUV5k
This High Uptime Kit allows you to store critical consumables onsite for the VUV5k. With this kit you are able to rapidly maintain your system if there is an issue.
- Electrode (Ta pins), 2 pcs
- Shield (Ta foil)
- Window Brazing (Ceramic window)
- O-Ring Set VUV 5050
- Set of conductive foil gaskets
MATRIX V1 & V2 Remote Coarse Motion Control Upgrade
It is Scienta Omicron’s goal to make our products as practical and user friendly as possible. This package upgrades our legacy MATRIX V1 & V2 Hardware versions to incorporate the Remotely Controllable features of our modern MATRIX 4 Units.
This Upgrade to Remote Coarse Motion Control upgrades legacy MATRIX V1 & V2 hardware and supplies a stand-alone GUI which interfaces to the hardware.
Analyser Control Upgrades
Efficient and accurate communications between the Analyser and the software are critical for high performance measurements. The newest standard for this system uses Ethernet compatible hardware and software components. Upgrading these components will bring your Analyser Control system up to the highest performance level possible. We are offering a package discount for our current customers who would like to upgrade their systems – please see the Upgrade Flyer for more information.
Read about the Next Generation Software Platform for Analyser Control - PEAK (Brochure).
VUV5k Source Head Flat Rate Repair
The VUV5050 source head needs regular maintenance for optimum performance. At our factory our experts are ready to inspect your VUV5050 in detail and go through a full factory test and tuning to make sure it is returned fully functional and in the best possible condition. All at a fixed price. A high uptime kit is included in the service and parts that are not used will be shipped together with the source as spares.
ARPES Capillary Upgrade
The Scienta Omicron Retractable VUV5k-package can be equipped with a newly developed exit stage. This exit stage contains a capillary custom made from glass with an exit inner diameter of 0.5 mm. This option offers the highest flux density in a very small spot. With the 5 mm standard working distance, the flux density of the 0.5 mm ARPES capillaries is more than twice that of the straight 0.8 mm capillaries, although the spot size is similar.
Deflection Upgrades for DA30-L(R) and DA30-L(W)
The deflection feature is a big advantage as it allows to keep the sample in a fixed position and instead uses the deflectors to change the angular range in θy projected on to the analyser slit. This ensures the same position of the sample is probed during the whole measurement. In addition, keeping the experimental geometry fixed throughout the measurement sequence avoids matrix element effects which are caused by variations in ionisation cross section for different photon to sample angles.
2xBNC Feedthrough Upgrade for LT STM: Best Signal Quality Achievable
The 2xBNC Feedthrough upgrade for LT STM enables the best signal quality that is achievable. The upgrade: enhances the measurement of tunneling current via tip or sample; includes dual biasing (sample and/or tip); and prevents leaking of current.
LT-SPM Cooled Sample Stage: Keep Your Sample at Continual Low Temperature
This package enables you keep your sample at continual low temperature. The package consists of compact design thermally coupled to LHe shield (<5K); includes pivoting mechanism that allows full access to STM stage with sample “parked”; enables 2 cooled sample stages – left and right side. Furthermore, it is a complete set that is easy to install; allows time saving as sample can be precooled; and it allows cold storage of sample during tip exchange.
LT-SPM Holder for Optical Elements: Optical Access to Sample Surface During Measurement
The package “LT-SPM holder for optical elements” enables optical access to sample surface during measurement via 2 optical access points at 90° and 270° with respect to the wobblestick axis. The tilt angle towards the sample face is 25°It includes lens holders for variable configuration, e.g. confocal lens system.
MATRIX 4.3.7 Software Release
Scienta Omicron has the following, the MATRIX 4.3.7 upgrade ready. This upgrade provides many new features: QPlus Atom Manipulation; Tip-Guard and Auto Approach; scanner max. number of points 4096; 64-bit control software; compatibility with all previous MATRIX hardware platforms; and software Licence on dedicated USB Stick, among others.
MATRIX AFM Control Upgrade: QPlus and Beam Deflection AFM Option
Scienta Omicron´s MATRIX AFM control upgrade is flexible and usable for QPlus modes and beam deflection. It includes: Kelvin regulator; digital AFM control board; digital phase-locked loop (PLL); and 6 additional input ports in the standard configuration.
QPlus Upgrade for LT STM: AFM Performance Close to Technically Feasible
The QPlus upgrade for LT STM provides AFM performance close to technically feasible. Highlights: New scanner and shielding design allows signal amplification/detection at atmospheric side; Atomic resolution on isolating surfaces as well as on conducting materials competitive to STM imaging (typ. 10pm corrugation); Ultimate performance together with new generation QPlus sensors (included in this upgrade package); Fundamental AFM performance proof on isolators; and AFM measurements in genuine df feedback.
RF-Filter for STM: dl/dt Spectroscopy with Outstanding Energy Resolution
The RF-Filter for STM upgrade package enables dl/dT spectroscopy with outstanding energy resolution. The STM dl/vD spectroscopy energy resolution is not limited by instrument. The filter adapters are easy to adapt on each LT-STM and TESLA-JT-SPM with BNC feedthrough. It includes the BNC-Preamp filter adapter and the DSUB filter adapter.
VT Sample Stage XA Upgrade: Maximum Compatibility, Ease of Use
The VT sample stage XA upgrade enables usage of standard sample plate design providing maximum compatibility with many different surface science techniques, like MBE, RHEED and different kinds of electron spectroscopy. Variable temperature from below 50K up to 650 K possible.
VT STM QPlus Upgrade: Full QPlus AFM Performance
The Scienta Omicron VT STM QPlus upgrade package is suited to combine high stability STM with QPlus AFM. Simultaneous current detection is possible, which is ideal to combine QPlus AFM and STM with the same sensor. It is suited for non-contact AFM with small oscillation amplitudes.
E-Beam Heater with Thoria Coated Filament Upgrade Package
Scienta Omicron manipulators can easily be upgraded with an E-Beam Heater Package to let your system benefit from its special functionality compared to a standard PBN heater. Due to the type of filament, chamber pressure increases are kept minimal and pressure as well as sample temperature recover on a faster time scale. Containing all required parts, the package comes pre-assembled for easy on-site implementation.
High sensitivity Auger Upgrade for Omicron SpectaLEED and MCPLEED Optics
This upgrade package contains two controllers and modern data acquisition software for Auger measurements. It includes a software package for LEED pattern analysis as well as a 12-bit high performance CCD camera.
High Temperature Heater Upgrade Package: For Standard Scienta Omicron Manipulators
Scienta Omicron manipulators can easily be upgraded with the High Temperature Heater Package to let your system benefit from higher accessible maximum sample temperatures as compared to a standard PBN heater. Containing all required parts, the package comes pre-assembled for easy on-site implementation.
Hot filament Ion Source for Sputter Etching and Depth Profiling
This cost-efficient and easy to use ion sputter source allows sputter cleaning, charge neutralisation, as well as basic depth profiling with a Gaussian beam shape. With a variable spot size of 300 μm-300 mm and a possible working distance in the range of 30-300 mm this ion source is flexible to use for a wide range of applications.
Ion Source: Compact, Easy-to-Handle Extractor Type Ion Source for Sample Cleaning
This package is a compact, easy-to-handle extractor type ion source for sample cleaning. The main features include: high ion beam current with Gaussian beam profile; operation with inert (Ar) and reactive gases (O2, H2, hydrocarbons with reduced lifetime); long lifetime; and high stability.
Mistral Upgrade Package
This is a Mistral graphical user interface upgrade for systems with discontinued Scienta Omicron mains / system controller V3/V4/V5. The main features include: easy to use touch-screen control and system overview for all valves and pump stages; control of a programmed system bake-out sequence; temperature read-out for the manipulator, and safety measurement with integrated interlocks.
NanoSAM PC Upgrade Package
The upgrade requires the return of the adapted frame grabber card PN01367, which will be installed on the new PC. The calibration cannot be imported automatically. We recommend a service visit to properly set up the TFE filament in the software and re-do calibration. A complete calibration requires the calibration samples PN01704 Si grid and PN01701 gold islands on carbon, which are usually supplied with each original delivery of an UHV Gemini system.
PBN Sample Heater Upgrade Package: For Standard Scienta Omicron Manipulators
This package is designed to upgrade the discontinued tungsten wire sample heater S7106, which was supplied with Scienta Omicron manipulators, with the current resistive sample heater solution. The coplanar Porolytic Boron Nitride heater element offers great uniformity, high durability and is easy to replace.
Scanning High Performance Fine Focus Ion Source
This high performance scanning fine focus ion source features with an excellent small spot size of < 150 μm and can be used for sputter etching, sensor cleaning, charge neutralisation and advanced depth profiling.
UHV Gemini PC Upgrade Package: To Windows 10 and SmartSEM 6.0 SP4
This PC and software upgrade includes: SEM measurement PC with 64-bit Windows 10 Enterprise operating system; SmartSEM v6.0 software kit with Service Pack 4; SmartSEM licence pack for UHV Gemini and new USB hardlock; fully pre-configured and custom integration of customer’s hardware; and Acronis backup software.