ACCESS-HAXPES
HAXPES as a Service for Advanced Surface Analysis
Non-destructive, bulk-sensitive analysis for cutting-edge research and development
Gain access to the unparalleled power of hard X-ray photoelectron spectroscopy (HAXPES) without the need for capital investment. We deliver cutting-edge material analysis tailored to your needs, offering precision, speed, and flexibility.
Unique information by HAXPES:
- Non-destructive & bulk-sensitive depth profiling
- Access to buried interfaces (up to 50 nm below the material surface)
- Access to chemical and electronic material properties
- Operando measurement possibilities
Applications, features and benefits
Core Features
- Deep HAXPES measurements
- Non-destructive and bulk-sensitive analysis
- Elemental characterization by HAXPES
- Chemical characterization of the elemental composition up to 50nm below the sample surface
Benefits
- Quick turnaround time for results
- Comprehensive analysis reports with metadata
- Flexible measurement time agreements
Add-Ons
- Advanced analysis services upon request
Get in touch with us at info@scientaomicron.com