Graph showing the sequential deflection along θy  | © Scienta Omicron

Deflection Upgrades for DA30-L(R) and DA30-L(W)

The deflection feature is a big advantage as it allows to keep the sample in a fixed position and instead uses the deflectors to change the angular range in θy projected on to the analyser slit. This ensures the same position of the sample is probed during the whole measurement. In addition, keeping the experimental geometry fixed throughout the measurement sequence avoids matrix element effects which are caused by variations in ionisation cross section for different photon to sample angles.

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