Local News - Japan
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ここでは、日本に関連するニュース、たとえば会議、顧客訪問、その他のニュースについて読むことができます。製品ページを日本語に翻訳するためにブラウザをご利用いただけることをお忘れなく、質問やご質問がある場合はお気軽にお問い合わせください。"
English version: "Welcome to Scienta Omicron's local news page! Here, you can read about news related to Japan, such as conferences, customer visits, and other updates. Don't forget that you can use your browser to translate product pages into Japanese, and please feel free to contact us if you have any questions or inquiries."
マテリアルズ イノベーション プラットフォーム
2023年3月に最先端のAPPES（準大気圧光電子分光装置：HiPP Lab）、UHVXPS（超高真空光電子分光装置：XPS Lab）、ARCプラズマ多元蒸着装置、試料自動搬送ロボット機構及び試料加熱処理室を連結した装置（Materials Innovation Platform：MIP）をNIMSに導入しました。富中博士率いるチームは、弊社のHiPP LabおよびXPS Labと冨中博士が開発したAI/MI技術を活用し、触媒生成条件の高効率最適化を進めています。複数のチャンバーとクラウドベースのデータベースを備えたこのシステムは、データの蓄積とAI/MIを用いた分析によって触媒技術の革新的な進化が期待されています！
English version: Materials Innovation Platform at NIMS! NIMS Japan installed a cutting-edge APPES/XPS MIP system in March 2023. Led by Dr. Tominaka, the team combines AI/MI technology with Scienta Omicron's HiPPLab and XPS Lab for optimized catalyst materials. The system, featuring multiple chambers and a Cloud-based database, revolutionizes data storage and analysis. Stay tuned for game-changing advancements in catalyst research!
JSR Annual Meeting 2024
2024年1月、アクリエ姫路にて開催されたJSR年次総会に参加しました。開催期間中は私たちの日本の営業チームに加え、スウェーデン本社からプロダクトマネージャーの橋本嵩広も現地参加いたしました。ブースへお立ち寄りくださった皆様に感謝申し上げます。
English version: We participated in the 2024 JSR Annual Meeting in Himeji City, Japan. Our Japanese sales team were on site together with our Product Manager Takahiro Hashimoto. We thank eveyrone who attended the conference and all researchers, engineers, and students involved in synchrotron radiation science, who came by our booth to speak with us.
Links to Product Information (in English)
Materials Innovation Platform
Scienta Omicron has a long history of providing customised solutions for the surface science field. Tailored instruments and large scale Materials Innovation Platforms (MIPs) offering unique capabilities is the best choice for the scientist breaking barriers in surface science techniques with extraordinary requirements.
Materials Innovation Platforms (MIPs) integrate instrumentation for growth with sophisticated in-situ characterization tools. Samples can thus be analysed at intermediate process steps to understand cause-effect correlations of a novel material’s growth and structure without leaving the clean UHV environment at any time. Scienta Omicron’s broad portfolio enables us to act as a single source supplier and a reliable partner for the design, production and in-field support, ensuring a smooth delivery process and a high system uptime.
Scanning Probe Microscopy
Our modern scanning probe microscopes offer ultimate mechanical stability, ultra-long hold times at liquid Helium temperatures, options for strong magnetic fields in a customized UHV system environment. We have carefully optimized our instruments to ensure outstanding signal qualities for QPlus and STM operation to ensure excellent results in all relevant scanning and spectroscopy modes. In addition, we have advanced controller technology enabling e.g. a new QPlus operation mode called QSPEED simplifying QPlus operation.
Our SPMs offer the most advanced techniques allowing for new experiments such as tip enhanced Raman, scanning tunneling luminescence, time resolved STM and electron spin resonance experiments enabled through adequate optical solutions or high frequency wiring.
Electron Spectroscopy
In 1983 – two years after receiving the Nobel Prize – Prof. Kai Siegbahn co-founded Scienta for the continued develoment of electron spectrometers and systems. Since the start, we have been the market leading, most innovative supplier of high-end photoelectron spectrometers.
Thin Film Deposition
Since 1998 we have focused on the increasing demands of the growth and characterisation of high-purity epitaxial layers (MBE) combined with in-situ scanning probe microscope (SPM) and electron spectroscopy (XPS, ARPES, SAM).
Scienta Omicron offers compact MBE systems for fundamental research. The available sample size ranges from flag style samples up to 4” wafer samples.