The electron analyser is a central component in any photoelectron spectroscopy setup. Scienta Omicron offers analysers with outstanding sensitivity and resolution as part of tailored systems and as individual components. Research groups choose our components to build their custom setups located in labs or at synchrotron beamlines across the world. Find the analyser for your application below and contact us for detailed information.
With these analysers, spatially resolved chemical state mapping with XPS is possible even at ambient pressures (APPES) and up to atmospheric pressure. Along with analysers specially developed for hard X-rays (HAXPES), these analysers enable XPS research in the fields of catalysis, liquids, and layered materials such as batteries, solar cells, and semiconductor devices.
Analysers for angular resolved (ARPES) applications enable spin resolved electronic band structure mapping across the surface Brillouin zone. These analysers extend the measurement capabilities for phaenomena such as superconductivity, topological insulators, and other interesting quantum materials for spintronic devices.
The DFS30 analyser features ground-breaking Electrostatic 3D Focus Adjustment technology - a major advancement in replacing imprecise mechanical movements with electronic precision and repeatability. This provides significantly improved workflow, speed, and reproducibility when optimizing experimental conditions. High quality ARPES measurements, particularly micro/nanoARPES, require optimised alignment of the photon spot, sample, and analyser focal point. The DFS30 simplifies this alignment with electronic adjustment of the analyser focal point in X, Y and Z (working distance) to the photoelectron emission spot.
Besides XPS and UPS, the DA30-L is especially developed for high quality ARPES measurements. Scienta Omicron´s deflector concept enables full cone angular scans in reciprocal space without sample movement. This allows electronic band structure mapping, even spin resolved, of the full surface Brillouin zone without changing measurement geometry, eliminating matrix element effects, and simplifying the interpretation of results dramatically.
The DA30-L-8000 analyser is a progression of the DA30-L analyser optimised for ultra-high resolution at low kinetic energies. Combined with Scienta Omicron´s deflector concept electronic band structure mapping of the full surface Brillouin zone without changing measurement geometry is possible. These are the models of choice for ARPES measurements below 3 eV kinetic energy with high demands for energy resolution.
The DA20 provides ARPES as well as XPS and UPS while maintaining a compact footprint. The DA20 includes the ground-breaking deflection technology that was previously only available in the larger DA30-L analyser models, enabling full cone ARPES measurements without sample rotation. This allows electronic band structure mapping of the surface Brillouin zone without changing measurement geometry, eliminating matrix element effects, and simplifying the interpretation of results dramatically.
The Scienta Omicron HiPP-2 analyser is developed for high pressure photoelectron spectroscopy (APPES) as well as hard x-ray photoelectron spectroscopy (HAXPES). This state-of–the-art analysis tool enables angle-resolved photoemission at ambient pressures up to 50 mbar and kinetic energies up to 10 keV, as well as the combination of the two.
The HiPP-3 analyser features state-of-the-art technology for outstanding imaging XPS at ambient pressures (APPES), with a spatial resolution better than 10 μm. In addition, the unique Swift Acceleration Mode enables unparalleled transmission, with count rates improved by up to a factor of 10.
The EW4000 electron analyser is a state-of-the-art and widely used electron analyser for HAXPES. It is also one of the key parts is Scienta Omicron’s HAXPES Lab. Expanding the parallel angular detection range to 60° in the full range from UPS via XPS to HAXPES gives great possibilities for high transmission measurements as well as novel Standing Wave and XPD experiments.
The Scienta ARTOF 10k analyser marked a revolution in the field of angle-resolved photoelectron spectroscopy (ARPES) for pulsed photon sources with its parallel full cone detection and unchallenged transmission. The Scienta ARTOF-2 is a further development of the concept especially for sources generating harmonics and kinetic energies above 10 eV.
The Argus CU analyser offers outstanding sensitivity, simple handling and maximum convenience during your XPS measurements. In addition, the Argus CU is accurately characterised for quantification and allows spectroscopy with excellent snapshot performance also when operated with large apertures.
3D Spin VLEED
The 3D Spin VLEED utilises the exchange scattering mechanisms to be 50x more efficient than Mott schemes. It is equipped with Ferrum VLEED detectors which mount on a proprietary transfer lens with high speed switching between channels. The DA30-L's unique deflection mode directs any part the full acceptance cone to the spin detectors without sample rotation for detection of in-plane and out-of-plane spin vectors.
PEAK is designed to control acquisition of photoelectron spectra with Scienta Omicron analysers. With its modern software architecture, PEAK offers improved performance for data acquisition, workflow, and live visualisation of data. The modular design and the modern network-based application programming interface (API) facilitate integration of additional equipment as well as full integration of the analyser in external control systems.