HAXPES Lab combined with XPS Lab

School of Materials, University of Manchester


Reference Number: 172812

HAXPES provides unique characterisation of a wide range of materials systems including:

  • Buried interfaces, such as active electronic layers below a surface capping layer
  • Depth-profiling through heterostructures and e.g. layered low-dimension materials
  • Probing of dopants and contaminants in the bulk of a material
  • Many interfaces such as thin films  on a substrate
  • HAXPES Lab 
  • Customised XPS 
  • EW4000
  • ARGUS 
  • XM 1000
  • HIS 13 

Integrated Instruments