MATRIX SPM Control
Modular Hardware and Software Concept
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- New high-performance AFM PLL for advanced QPlus® AFM
- TipGuard and PLL Guide
- Fast operating QPlus® AFM at low- and room-temperatures
- Integrated Lock-In
- New compact design
The MATRIX 4 Control System builds on 30 years of experience in SPM technology and unlocks the full capacity of our leading-edge Scanning Probe Microscopes. The key features include intuitive and flexible experiment control; best-in-class noise floor; ultimate QPlus® capability; full 64-bit software; and modular upgrade paths.
The MATRIX 4 Control System builds on 30 years of experience in SPM technology and unlocks the full capacity of our leading-edge Scanning Probe Microscopes. The MATRIX architecture couples advances in high-speed, low-noise digital electronics with the requirements of the latest SPM applications to offer the user an unprecedented level of signal quality, measurement speed, and experimental flexibility. The expandable design provides solutions for future challenges in Scanning Probe Microscopy.
MATRIX 4 QPlus Control System includes advanced AFM PLL hardware. The PLL is well proven and has supported many leading scientists in their daily work by offering all standard types of AFM measurements as well as the flexibility to program advanced experiments via the MATE control interface. There is a basic mode for reliable and safe measurements, requiring minimum effort to initiate the experiments. Users can also directly switch to an expert mode giving access to the complete parameter space of an AFM PLL.
Preset options in MATRIX 4 for AFM perform high quality, high resolution QPlus with easy switching to other modes with a few mouse clicks.
TipGuard - Tip Protection
MATRIX 4 includes an advanced TipGuard system that extends tip life-time and facilitates uninterrupted measurements in non-ideal environments. The TipGuard is convenient, and automatically continues experiments after a safety event. The TipGuard hardware and software take several parameters like phase or amplitude into account. Advanced users can individually parameterize the TipGuard and weight the individual trigger thresholds.
Instead of mixing or switching input signals, the TWIN Regulator has two independent complete feedback loops, allowing for separate but simultaneous optimisation of the two regulation signals. Therefore the TWIN Regulator dramatically improves the efficiency of research work by enabling a seamless transition between modes. The TWIN Regulator also opens up chances for unique experiments by combining or mixing different feedback signals.
Tunneling and Force Spectroscopy
The MATRIX Control System realises a n-dimensional concept for data acquisition and data handling and is therefore the ideal platform for tunneling and force spectroscopy. The spectroscopy control window provides a quick method of viewing and setting parameters such as start and end values, number of points, grid settings, slew rates, delay times and the spectroscopy mode. It also provides activation of ramp reversal and repetitions (multiple curve measurement). The MATRIX Automated Task Environment (MATE) allows the user to modify the standard set up for custom experiments.
Beam Deflection AFM Control
The AFM controller (including QPlus) with digital PLL is an integral solution for the MATRIX control system and a perfect match with Scienta Omicron's Scanning Probe Microscopes. It increases flexibility and improves usability. It offers an integrated regulator for Scanning Kelvin Probe Experiments. The superior signal-to-noise characteristic is proven by experiments.
MATRIX 4: The SPM Controller Evolution
The MATRIX 4 Control System builds on 30 years of experience in SPM technology and unlocks the full capacity of our leading-edge Scanning Probe Microscopes. The key features include 1) intuitive and flexible experiment control; 2) best-in-class noise floor; 3) ultimate QPlus capability; 4) full 64-bit software; and 5) modular upgrade paths.
MATRIX 4: Beam Deflection AFM Option
The Scienta Omicron MATRIX 4 Beam Deflection and Plus AFM Control System with digital PLL is an integral solution for the MATRIX control system and a perfect match with the Scienta Omicron SPMs. Includes sensor alignment & control, light source control, resonance/phase curve acquisition, amplitude channel, automatic phase adjustment and more. Processor board with an integrated Kelvin regulator.
ZyVector: STM Control System for Lithography
Scienta Omicron and Zyvex Labs announce a collaboration to develop and distribute tools for research and manufacturing that require atomic precision. The ZyVector STM Control System from Zyvex Labs turns a Scienta Omicron STM into an atomically-precise scanned probe lithography tool, and will be distributed world-wide by Scienta Omicron.
Zyvex Labs pursues research and develops tools for creating quantum computers and other transformational systems that require atomic precision, towards its eventual goal of Atomically Precise Manufacturing. As part of this effort, ZyVector turns the world-class Scienta Omicron VT-STM into an STM lithography tool, creating the only complete commercial solution for atomic precision lithography.
Zyvex CHC Controller
Scienta Omicron and Zyvex Labs announce a new leap forward in STM design; real- time position correction. The ZyVector STM control system from Zyvex Labs uses live position correction to enable atomic-precision STM lithography. Now the same live position correction technology is brought to the Matrix STM control system for microscopy and spectroscopy users, enabling fast settling times after large movements in x, y and z, and precise motion across the surface, landing and remaining at the desired location.