HAXPES Lab combined with XPS Lab

Reference Number: 172812

HAXPES provides unique characterisation of a wide range of materials systems including:

Buried interfaces, such as active electronic layers below a surface capping layer
Depth-profiling through heterostructures and e.g. layered low-dimension materials
Probing of dopants and contaminants in the bulk of a material
Many interfaces such as thin films on a substrate