NanoESCA for Momentum Microscopy and Imaging XPS

MPI für Festköperforschung - Grenzflächenanalytik

PES ARPES XPS PEEM Momentum Microscopy iXPS μARPES

Reference Number: 142712

The research group of Prof. Starke investigates the atomic structure of surfaces and thin films of technologically interesting quantum materials with the goal of a fundamental understanding of growth, interface formation and crystal formation at the atomic scale. A particular topic is epitaxial graphene on silicon carbide surfaces. The imaging x-ray spectroscopy capability will be used to identify the chemical composition of the surface, which gives crucial additional information about the exact conditions of the local sample spot from where the band structure was acquired. 

  • HIS 14 VUV source for momentum microscopy
  • Monochromated x-ray source  for imaging XPS

Integrated Instruments