Multichannel high resolution electron energy loss spectroscopy (HREELS) enables direct observation of the dispersion of collective excitations at surfaces, such as phonons. The Scienta Omicron MCES150 monochromatic electron source, combined with an electron analyser for angle-resolved photoemission spectroscopy (ARPES) such as the DFS30, DA30-L and DA20, creates a powerful platform for multichannel HREELS measurements. The combination of a highly collimated electron beam and the analyser’s 2D detector delivers excellent energy and angular resolution, while simultaneous multichannel acquisition reduces the measurement time by orders of magnitude compared to conventional HREELS approach.
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Specifications
< 3 meV(*)
3 - 150 eV
0.04 x 1 mm2
54 mm
DN100CF (6" O.D.)
< 130 °C
(*) The MCES150 source resolution is demonstrated to be <2.1 meV for the setup at high currents by deconvolving the 3.3 meV analyser resolution from the total experimental resolution of 3.9 meV.
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Results
Electron Energy Loss Spectroscopy with Parallel Readout of Energy and Momentum
We introduce a high energy resolution electron source that matches the requirements for parallel readout of energy and momentum of modern hemispherical electron energy analyzers. The system is designed as an add-on device to typical...
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HREELS: Multichannel HREELS for exploring phonon dispersions and beyond
Multichannel high resolution electron energy loss spectroscopy (HREELS) enables direct observation of the dispersion of collective excitations at surfaces, such as phonons. The Scienta Omicron MCES150 monochromatic electron source, combined with an electron analyser for angle-resolved photoemission spectroscopy (ARPES) such as the DFS30, DA30-L and DA20, creates a powerful platform for multichannel HREELS measurements. The combination of a highly collimated electron beam and the analyser’s 2D detector delivers excellent energy and angular resolution, while simultaneous multichannel acquisition reduces the measurement time by orders of magnitude compared to onventional HREELS approach.