SXM Controller
Full SPM Control Electronics Including PLL and Lock-In Amplifier
SPM LT SPM VT SPM STM STS LT STM VT STM SP-STM SP-STS IETS BEEM TERS HDL Manipulation Nanolithography 4P-SPM AFM c-AFM nc-AFM QPlus AFM EFM FMM FM-AFM KPFM LFM MFM SCM
- 24 Bit A/D & D/A Converters
- Fast 22 Bit D/A Converter for Z
- Integrated Lock-in Amplifiers
- PLL for Tuning Fork Based NC-AFM
- Easy Access to all Signals
- Measurement & Data Analysis Software Included
The new digital SXM Control System incorporates advances in state-of-the-art electronics and latest software algorithms to fulfill the needs of today’s and future challenges in scanning probe microscopy. Features of the new SXM Controller include low noise, large detection bandwidth, high resolution 24 bit D/A and A/D converters, easy software and hardware handling, accessible and simple file format and a basic data analysis software package. In combination with 32 bit data handling, the outstanding fast 22 bit D/A converter for Z-regulation sets a new benchmark for SPM controllers as it overcomes the classic restrictions (resolution and voltage stability) of existing 16 or 20 bit solutions. The controller comes with an integrated phase locked loop (PLL) for piezoelectric cantilever based non-contact AFM (NC-AFM) and lock-in amplifiers for high-resolution spectroscopy (e.g. dI/dU, dI2/dU²).
Software functionalities such as continuous monitoring and observation of simultaneously measured signals in an Oscilloscope window, and quantitative FFT spectrum analysis makes this a user friendly and efficient solution. The extensive software package for scanning probe spectroscopy and atom manipulation enables a variety of experiments ranging from standard imaging and spectroscopy to user defined spectroscopy and manipulation experiments. A graphical user interface for implementation of macros for custom tailored experiments ensures experimental flexibility and expandability to cope with future experimental work flows and challenges.
More Information
STM Results
STM: Au(111)@ 9.6 K. Instrument: INFINITY SPM with SXM controller.
dI/dV spectrum showing the Au surface state. Instrument: INFINITY SPM with SXM controller.
dI/dV spectrum showing the Au surface state. Instrument: INFINITY SPM with SXM controller.
QPlus AFM Results
QPlus®: NaCI(001) single crystal @ 9.7 K (A=330 pmpp). Instrument: INFINITY SPM with SXM controller.
QPlus®: NaCI(001) single crystal @ 9.7 K (A=330 pmpp). Instrument: INFINITY SPM with SXM controller.
QPlus®: NaCI(001) single crystal @ 9.7 K (A=13 pmpp). Instrument: INFINITY SPM with SXM controller.
Software Suite
Software functionalities such as continuous monitoring and observation of simultaneously measured signals in an Oscilloscope window, and quantitative FFT spectrum analysis makes this a user friendly and efficient solution. The extensive software package for scanning probe spectroscopy and atom manipulation enables a variety of experiments ranging from standard imaging and spectroscopy to user defined spectroscopy and manipulation experiments. A graphical user interface for implementation of macros for custom tailored experiments ensures experimental flexibility and expandability to cope with future experimental work flows and challenges.
Software Functionalities at a Glance
- STM & NC-AFM qPlus mode
- Single point spectroscopy, spectroscopy along a line, and grid spectroscopy (I(U), df(U), df(z), I(z), Ext(U), dI/dU...)
- Oscilloscope (time or frequency domain)
- Manual tip control (X, Y, Z)
- Drift correction
- PLL for tuning fork based NC-AFM
- STM feedback loops: logarithmic or linear
- Coarse motor operation via software or joystick
- Basic analysis/image processing software
- Tip conditioning
- Programming and execution of macros for custom experiments
- Lock-in amplifiers for independent signal analysis
- Easy software access to D/A converters
- Combined STM/AFM experiment
- Atom manipulation
- Python interface
- …
Downloads
SXM: SPM Control System
The new digital SXM Control System incorporates advances in state-of-the-art electronics and latest software algorithms to fulfill the needs of today’s and future challenges in scanning probe microscopy (SPM). The key features include: 1) 24 Bit A/D & D/A converters; 2) fast 22 Bit D/A converter for Z; 3) Integrated lock-in amplifiers; 4) PLL for tuning fork based; 5) NC-AFM; and 6) easy access to all signals
