XPS Lab  | © Scienta Omicron
XPS Lab system with Monochromated X-ray source and electron flood gun for charge neutralisation.
Internal components of the XPS Lab  | © Scienta Omicron
Advanced in-situ photoelectron experiments are enabled by virtually live snapshot data acquisition and extended sample manipulation possibilities, e.g. a wide temperature range (130 < T < 1100 K).

XPS Lab

Versatile Electron Spectroscopy Platform

PESXPSiXPSARXPSSputter ProfilingCharge Comp

  • Outstanding quantitative XPS performance
  • Compact footprint with excellent accessibility
  • User-friendly experiment control and data acquisition software
  • Versatility configurable to meet individual demand
  • Sub-system for Materials Innovation Platform (MIP)

The XPS Lab has been designed to combine outstanding quantitative XPS performance and ease of operation with a modular sample handling concept. This X-ray photoelectron spectrometer can host complementary surface analytical techniques, like AES and UPS, to enhance its characterisation capabilities. The exceptional value of the XPS Lab is based on the high-transmission high-speed Argus CU hemispherical analyser.

The XPS Lab is a surface science UHV system, designed for X-ray and VUV photoelectron spectroscopy experiments. Thereby, the surface composition and detailed information about chemical states of virtually every material are accessible.

The system can be tailored to the desired configuration in many ways, e.g. regarding sample handling and the set of analytical devices combined. It is fully compatible with all types of Scienta Omicron flag style sample holders. Well-defined interfaces ensure the expandability with Scienta Omicron systems providing various thin-film deposition and analysis techniques (MBE, SPM, AFM, ARPES and many others).

The system is intended for Scienta Omicron's hemispherical energy analysers. It is optimized for XPS investigations with excitation sources in magic-angle geometry (54.7°), to allow straightforward data analysis. The XPS Lab system comes completely assembled and fully tested as a turn-key system to enable fast and reliable implementation at the customers’ laboratory.

More Information

XPS Lab Options

Labelled drawing of the XPS Lab Components | © Scienta Omicron
XPS Lab system design and a selection of available options.

The XPS Lab is configured with the high transmission Argus CU hemispherical analyser and high power monochromated Al Kα X-ray source, specifically combined to offer the highest sensitivity for quantitative XPS analysis. To complement and extend the standard XPS functionality, a broad range of dedicated options are available to ensure that the XPS Lab can provide the experimental solutions your laboratory needs, no matter how diverse.

Handling Concept

The XPS Lab offers two sample handling concepts. The standard configuration is designed for small sample plates. It can either be directly integrated to Scienta Omicron’s broad range of surface science instruments or serve as a standalone tool with an independent sample load lock, which allows the introduction of three sample plates during one loading/unloading cycle.

The alternative concept is based on the Large Sample Carrier with 30 cm² loading area for differently shaped specimens. This exceptionally versatile specimen handling system allows not only the automated sequential measurement of multiple samples and positions but also enables the application of specialised sample holders, like the powder sample holder and the atmosphere container for air-sensitive specimen. The integrated calibration block simplifies periodic routine measurements to ensure the reliability of the acquired data.

Flag Style Sample Plates

The flag style small sample stage offers unlimited compatibility with the full Scienta Omicron product range.

Large Sample Carrier

Cross-sectional view of the XPS Lab illustrating two sample handling concepts. The Large Sample Carrier allows for mounting multiple samples and offers great flexibility for size and shape of sample specimen.

Specifications

Base pressure

< 2*10-10 mbar*

Chamber materials

Non-magnetic steel or mu-metal

Sample Handling Options

Flag type sample plates or

Large Sample Carrier or

Wafer up to 4” diameter

Features

128 data channel detection

Large area XPS

Selected area XPS

Angle resolved XPS

Snapshot XPS

Monochromated Al Kα**

Charge neutralisation**

Imaging XPS**

Sputter depth profiling**

Gas cluster ion beam sputtering**

VUV light source for UPS**

Electron source for AES**

Sample biasing

Sample heating **

Sample cooling **

Compucentric Zalar rotation***

* Specification for pump configuration consisting of Turbomolecular pump, Ion getter pump and Titanium sublimation pump.

** Optionally available.

*** Optionally available. Requires Large Sample Carrier upgrade.

 

For full specifications and more information about product options, please do not hesitate to contact your local sales representative.

Reference systems

Molecular Beam Epitaxy (MBE), Atomic Layer Deposition (ALD), and in-situ X-Ray Photoelectron Spectroscopy Laboratory | © Scienta Omicron
163504

Materials Innovation Platform (MIP) with MBE, ALD, and XPS

The group’s multidisciplinary research focuses on the growth, characterisation, and device physics of quantum and semiconductor materials for novel devices and applications. Their approach utilises advanced molecular beam epitaxy techniques, selective area atomic layer deposition, and highly developed materials characterisation to fundamentally understand the nucleation and growth process, material nanostructure, chemical bonding, and experimentally determined band structure. They then correlate those findings with advanced electrical transport and magnetic measurements from devices that they fabricate to take full advantage of the novel properties of the materials and heterostructures that are created. Their current research interests include semiconductor defects for quantum communication, topologically protected transport in semiconductors and metals, magnetic properties in 2D materials, and back-end-of-line materials and device integration.

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HAXPES and ESCA2SR System with the HAXPES Lab, Customised XPS,  EW4000, ARGUS,  XM 1000, and HIS 13 components  | © Scienta Omicron
172812

HAXPES Lab combined with XPS Lab

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XPS Lab  | © Scienta Omicron
173204

XPS Lab for Small Samples

The XPS Lab is a surface science UHV system, designed for X-ray and VUV photoelectron spectroscopy experiments. Thereby, the surface composition and detailed information about chemical states of virtually every material are accessible.

more
UHV Cluster System at the D&S Research Center, Samsung Electronics Co.,Ltd. | © Scienta Omicron
183917

Surface Science Analysis Cluster System

Cluster system offering multiple complementary surface science techniques, as XPS, UPS and AFM for detailed sample characterisation. The analysis system is integrated into a linear transfer line to ensure future expandability.

more
ESCA 2SR  | © Scienta Omicron
163320

XPS Lab for Large Samples

The XPS Lab is a surface science UHV system, designed for X-ray and VUV photoelectron spectroscopy experiments. Thereby, the surface composition and detailed information about chemical states of virtually every material are accessible.

more

Downloads

XPS Lab: Versatile Electron Spectroscopy Platform

1.88 MB

The XPS Lab has been designed to combine outstanding quantitative XPS performance and ease of operation with a modular sample handling concept. The exceptional value of the XPS Lab is based on the high-transmission and high-speed Argus CU hemispherical analyser.

Services & Spare-parts

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