NanoESCA System Product  | © Scienta Omicron
New compact NanoESCA system.
NanoESCA System with components labelled  | © Scienta Omicron
The NanoESCA is based on the combination of a Photoemission Microscope with an imaging double-hemispherical energy filter (IDEA). It allows for analysing the electronic band structure of very small features of inhomogeneous and/or structured samples.
Momentum Microscopy on a clean Au (111) surface | © Scienta Omicron
Momentum Microscopy on a clean Au (111) surface. The overview momentum map of the Fermi energy (a) shows more than a full Brillouin zone, while the zoomed in map resolves features like the Rashba surface splitting. Acquiring these momentum maps for all energies in the valence band leads to a 3D data stack (c), which can be cut in any high symmetry direction (d) to study the band structure of a material. The shown measurements were performed in a laboratory setup with a HIS 14 VUV light source (photon energy 21,18 eV (He I)) and a liquid He cooled manipulator (T = 30 K). The energy analyzer was set to 50 meV energy resolution.

NanoESCA

Next Generation Photoemission Tool for Real- and Momentum Microscopy

PESXPSPEEMEF-PEEMMomentum MicroscopySpin Momentum MicroscopyμARPESARPESSpin-ARPESHAXPES

  • Live View energy-filtered real & momentum space imaging
  • Precise sample spot definition for small area ARPES
  • One-shot 180° ARPES overview without sample movement
  • LHe cooled microscope sample stage and dedicated light-sources
  • Excellent 2D imaging energy resolution (< 25 meV)

The NanoESCA is an energy-filtering photoemission microscope that can easily switch between the imaging of the momentum space and the real space of photoemission electrons. It’s wide range of measurement modes makes it predestined for momentum microscopy, ARPES of very localised features, and imaging spectroscopy (e.g. with X-ray lab-source or synchrotron).

Photoemission has a history as one of the leading techniques in material and surface science. In the last decade, 2D k-space imaging or "Momentum Microscopy" has become one of the latest and most promising developments in this field. It allows insight into the electron band-structure of novel material systems, unveiling useful effects that can have a strong impact in future information technology. In combination with real-space imaging it is the ideal tool to make new materials applicable to next-generation devices.

Band structure is the key to understanding the working principals of nearly all solid-state devices (transistors, microprocessors, LEDs, solar cells, etc.). New material classes including graphene, topological insulators, and transition metal dichalcogenides (TMDs) are examined for their use in future electronic devices. TMDs, especially, are chemically versatile and thus predestined to tune their electronic structure for various applications. Momentum Microcopy provides a fast band structure mapping, which becomes essential for device engineering in the future.

Momentum Microscopy describes the combination of a photoemission electron microscope (PEEM) with an imaging band-pass energy filter. For kinetic electron energies up to 40 eV the microscope collects all photoelectrons emitted into the complete solid angle above the sample surface. For a discrete energy (selected by the band-pass filter) it forms an image of the photoelectron distribution as a function of the lateral momentum (kx, ky). For example, it is possible to see a full Brillouin zone for certain energies, (e.g. the Fermi surface) in one shot. In live-view mode, it is possible to navigate through the band structure, zoom into details or adjust apertures. By scanning a range of energy filtered momentum maps, one directly gets a 3D data cube (lateral electron momentum vs. electron binding energy) which represents the accessible electronic band structure of the material under investigation.

More Information

How the NanoESCA Works

The extended PEEM lens is designed to easily switch between real-space imaging and momentum-space imaging by switching the projection lens settings. At the same time, the electron trajectories in both modes are equal up to the first image plane. This implies that one can use the two different apertures integrated into the PEEM column. The first one at the back focal plane of the objective lens (contrast aperture) restricts the angular acceptance of the microscope. In real-space imaging this reduces the spherical aberration and thus enhances the resolution of the PEEM. For momentum space imaging it is typically fully open. The second aperture is an iris-aperture. As shown in Figure, it can be used to define a small emitting area on the sample (< 6 μm), from which photoelectrons are measured in momentum mode.

Micro-ARPES as Key-Application

Besides the imaging energy-filter, the lens extension of the PEEM, which allows one to image the momentum distribution, is the key feature of the Momentum Microscope. This extended PEEM lens is designed to easily change between real-space imaging and momentum-space imaging by switching the projection lens settings. At the same time, the electron trajectories in both modes are equal up to the first image plane. This implies the usage of the two different apertures integrated into the PEEM column. The first one at the back focal plane of the objective lens (contrast aperture) restricts the angular acceptance of the microscope. In real-space imaging, the spherical aberration is reduced and thus enhances the resolution of the PEEM. For momentum space imaging, it is typically fully open. The second aperture is an iris aperture to define a small emitting area on the sample (< 6 µm) from which photoelectrons are measured in momentum mode. The work-flow of micro-ARPES includes finding special features on the sample surface, isolating them by closing the iris aperture around them, and then switching to momentum space mode to complete band structure imaging from a well-defined spot on the sample. This technique does not depend on the beam spot of a light source like conventional ARPES or imaging XPS, which uses a scanning beam spot. To search for features on the sample in real-space mode, the field of view can be zoomed from 800 μm in diameter to 6 μm.

Imaging Spectroscopy in Real-Space

Over the last decades standard XPS instruments (ESCA+) have matured towards routine sample analysis and instrument development is dominated mainly by software integration and ease-of-use.

Approaches towards new instrumentation beyond routine XPS sample analysis have been rare and imaging XPS with lateral resolution below 1 µm stayed long out of reach.

The unique approach of a high resolution entrance lens and the revolutionary energy analyser concept (IDEA = imaging double hemispherical energy analyser) allowed NanoESCA to breach this barrier. In contrast to standard secondary electron microscopy (SEM) or x-ray beam induced secondary imaging (SXI) high lateral resolution PEEM imaging with excellent energy resolution allows detailed pre-analysis of the sample far beyond pure sample navigation.

As a result much deeper understanding of the local sample structure, chemistry and electronic structure becomes possible with NanoESCA - an instrument truly designed for imaging.

Specifications

Energy resolution, analyser

< 25 meV

Energy range

0 - 200 eV (up to 10 keV optional)

Momentum resolution, analyser

< 0.02 Å-1

Momentum resolved range

± 2.5 Å-1

Equivalent angular range

± 90° (full solid angle)

Lateral resolution

< 40 nm

Real-space field of view

6 ... 800 μm

Base pressure, analysis chamber

< 1E-10 mBar

VUV photon flux density

Up to 1E13 ph/s/mm²

VUV beam spot size

< 300 μm

VUV energy-resolution

< 2 meV (He I)

Laser/synchrotron port

Available

Manipulator axis, motorised

x, y, z, azimuthal

x/y precision

< 3 μm

Manipulator temperature range

< 40 K .. 600 K

For full specifications and more information about product options, please do not hesitate to contact your local sales representative.

Reference systems

NanoESCA for Momentum Microscopy | © Scienta Omicron
115201

NanoESCA for Momentum Microscopy and XPS System

Investigation of :

  • Ferroelectrica, (BaTiO3, BiFeO3)  
  • Resistive oxide memories (post – CMOS technology)
  • Graphene on SiC

more
A group of Scienta Omicron and School of Chemistry, University of Bristol researchers standing with the NanoESCA System.  | © Scienta Omicron
122407

NanoESCA Lab for Momentum Microscopy with XPS System

The Bristol NanoESCA Laboratory (BrUNEL) is the newest and one of the most advanced surface analysis instruments in UK

  • Spatially resolved ARPES; 2D materials; Band structure; Graphene; Transition metal dichalcogenides; 2D heterostructures
  • Growth of films of diamond, diamondlike carbon (DLC) amorphous carbon (a-C), and other related materials such as zinc oxide

more
NanoESCA at Grenzflächenanalytik, MPI für Festköperforschung  | © Scienta Omicron
142712

NanoESCA for Momentum Microscopy and Imaging XPS

The research group of Prof. Starke investigates the atomic structure of surfaces and thin films of technologically interesting quantum materials with the goal of a fundamental understanding of growth, interface formation and crystal formation at the atomic scale. A particular topic is epitaxial graphene on silicon carbide surfaces. The imaging x-ray spectroscopy capability will be used to identify the chemical composition of the surface, which gives crucial additional information about the exact conditions of the local sample spot from where the band structure was acquired. 

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NanoESCA | © Scienta Omicron
143971

NanoESCA Lab with Imaging Spin-Filter

The latest state of the art NanoESCA MK III end station will be equipped with a series of preparation and characterization techniques and will enable:

  • Unrivalled new time-, energy-, spin-, angular- and laterally resolved photoelectron spectroscopy.
  • The NanoESCA MK III at ELI-ALPS beam line is expected to provide significant contributions in e.g. molecular electronics, magnetic data storage or solar panel

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NanoESCA | © Scienta Omicron
162616

NanoESCA for Momentum Microscopy

The state-of-the-art  “Ernst-lab” will be combined with a femtosecond laser facility and with the NanoESCA will allow studies of new nanomaterials such as:

  • Deposited clusters and nanowires prepared in helium -droplets
  • Lithographically prepared nanostructures
  • Nanoscale metallic materials with tailored properties
  • Materials synthesized by chemical vapour deposition
  • Topological insulators
  • Development of new efficient catalysts 
  • Plasmonic sensors 
  • Tailored materials for quantum information technology

more
SPIN NanoESCA System with the NanoESCA Lab and IDEA Components  | © Scienta Omicron
171104

NanoESCA Lab with Imaging Spin Filter

The Trondheim NanoESCA System is built on a small foot-print frame for installing it on a synchrotron or laser beamline. It is furthermore equipped with an imaging Spin-Filter.

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Downloads

NanoESCA: Next-Generation Photoemission Tool

1.49 MB

The Scienta Omicron NanoESCA is a cutting edge instrument with a “Live View” energy-filtered real- & momentum space imaging, offering precise sample spot definition for small area ARPES. The other key features include 1) one-shot 180 degree ARPES overview without sample movement; 2) LHe cooled microscope sample stage and dedicated light-sources; and 3) Excellent 2D imaging energy-resolution.

NanoESCA II: The Ultimate PEEM Instrument

923.67 KB

NanoESCA II is the technical refinement of the NanoESCA I. Simply said, it is the ultimate PEEM instrument. NanoESCA II combines high special resolution and excellent spectroscopy performance in a single instrument allowing for forefront photoemission research on micro and nano scales. One application for high resolution micro area spectroscopy is μARPES on localized 2D materials with outstanding momentum resolution using laboratory excitation sources.

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