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UHV Multi-technique Surface Analysis System | © Scienta Omicron
121564

UHV Multi-technique Surface Analysis System

Air Force funded facility for analysis of wide ranging samples submitted by different customers within the Air Force Institute of Technology.

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MULTIPROBE System with XPS, UPS, LS STM, LEED and MBE Sources | © Scienta Omicron
81003

MULTIPROBE System with XPS, UPS, and Large Sample SPM

Research focus on the relation between electronic properties and device performances of Dirac electrons and two-dimensional electron systems such as graphene and GaN and controlling the surface structural and electronic properties of graphene in terms of the crystallographic orientation of the Si substrate.

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