We are sorry. This instrument is obsolete. Please have a look on our newest products

DAR 400


Reference systems

NanoSAM Lab, FIG 5 and DAR 40 at the Physikalisches Institut, Technische Universität Clausthal | © Scienta Omicron

NanoSAM Lab with Sputter Depth Profiling and XPS

Central lab facility for materials characterisation on the nm scale with SEM, SAM, XPS and sputter depth profiling capabilities.

NanoESCA for Momentum Microscopy | © Scienta Omicron

NanoESCA for Momentum Microscopy and XPS System

Investigation of :

  • Ferroelectrica, (BaTiO3, BiFeO3)  
  • Resistive oxide memories (post – CMOS technology)
  • Graphene on SiC

Materials Innovation Platform (MIP) with Five Deposition Modules and XPS, UPS, AES, ISS, SPM | © Scienta Omicron

Materials Innovation Platform (MIP) for Novel Quantum Materials

Materials Innovation Platform (MIP) to enable research on the combination of different material classes for the development of novel quantum materials.

Combined ARPES and MBE System for In-situ of Novel Materials | © Scienta Omicron

Combined ARPES and MBE System for Novel Materials

A multi-technique system, consisting of a Molecular Beam Epitaxy (Lab10 MBE) module and an Angle-Resolved Photoelectron Spectroscopy (ARPES Lab) module. It is configured for in-situ investigation of novel intermetallic compound materials and coupling to an existing transfer line in a clean room laboratory.

UHV Multi-technique Surface Analysis System | © Scienta Omicron

UHV Multi-technique Surface Analysis System

Air Force funded facility for analysis of wide ranging samples submitted by different customers within the Air Force Institute of Technology.

MULTIPROBE System with XPS, UPS, LS STM, LEED and MBE Sources | © Scienta Omicron

MULTIPROBE System with XPS, UPS, and Large Sample SPM

Research focus on the relation between electronic properties and device performances of Dirac electrons and two-dimensional electron systems such as graphene and GaN and controlling the surface structural and electronic properties of graphene in terms of the crystallographic orientation of the Si substrate.

R3000 and LT-SPM | © Scienta Omicron

LT STM Lab with R3000 for ARPES

MULTIPROBE LT XA platform in Nottingham, GB, delivers High-Performance STM/AFM (QPlus) and High-Resolution UPS/ARPES results. 

Tailored Multichamber MBE System from Scienta Omicron | © Scienta Omicron

Materials Innovation Platform (MIP) with MBE, PVD and Surface Analysis

Research focus on nanoscale materials, interfaces and advanced devices including, high-k gate dielectrics, gate electrodes and novel 2D materials (TMDs, e.g. MoS2). 


Services & Spare-parts

For spare parts, please check the service product finder or contact the service team.