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We are sorry. This instrument is obsolete. Please have a look on our newest products
DAR 400 | © Scienta Omicron

DAR 400

PES

Reference Systems

NanoSAM Lab, FIG 5 and DAR 40 at the Physikalisches Institut, Technische Universität Clausthal | © Scienta Omicron
84406

NanoSAM Lab with Sputter Depth Profiling and XPS

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NanoESCA for Momentum Microscopy | © Scienta Omicron
115201

NanoESCA for Momentum Microscopy and XPS System

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Materials Innovation Platform (MIP) with Five Deposition Modules and XPS, UPS, AES, ISS, SPM | © Scienta Omicron
121547

Materials Innovation Platform (MIP) for Novel Quantum Materials

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Combined ARPES and MBE System for In-situ of Novel Materials | © Scienta Omicron
152801

Combined ARPES and MBE System for Novel Materials

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UHV Multi-technique Surface Analysis System | © Scienta Omicron
121564

UHV Multi-technique Surface Analysis System

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MULTIPROBE System with XPS, UPS, LS STM, LEED and MBE Sources | © Scienta Omicron
81003

MULTIPROBE System with XPS, UPS, and Large Sample SPM

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R3000 and LT-SPM | © Scienta Omicron
63209

LT STM Lab with R3000 for ARPES

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Tailored Multichamber MBE System from Scienta Omicron | © Scienta Omicron
035008

Materials Innovation Platform (MIP) with MBE, PVD and Surface Analysis

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For spare parts, please check the Service Finder or contact the service team.
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