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DAR 400 | © Scienta Omicron

DAR 400

Reference Systems

NanoSAM Lab, FIG 5 and DAR 40 at the Physikalisches Institut, Technische Universität Clausthal | © Scienta Omicron

NanoSAM Lab with Sputter Depth Profiling and XPS

NanoESCA for Momentum Microscopy | © Scienta Omicron

NanoESCA for Momentum Microscopy and XPS System

Materials Innovation Platform (MIP) with Five Deposition Modules and XPS, UPS, AES, ISS, SPM | © Scienta Omicron

Materials Innovation Platform (MIP) for Novel Quantum Materials

Combined ARPES and MBE System for In-situ of Novel Materials | © Scienta Omicron

Combined ARPES and MBE System for Novel Materials

UHV Multi-technique Surface Analysis System | © Scienta Omicron

UHV Multi-technique Surface Analysis System

MULTIPROBE System with XPS, UPS, LS STM, LEED and MBE Sources | © Scienta Omicron

MULTIPROBE System with XPS, UPS, and Large Sample SPM

R3000 and LT-SPM | © Scienta Omicron

LT STM Lab with R3000 for ARPES

Tailored Multichamber MBE System from Scienta Omicron | © Scienta Omicron

Materials Innovation Platform (MIP) with MBE, PVD and Surface Analysis

Services & Spare-parts

For spare parts, please check the Service Finder or contact the service team.