VT SPM XA with with eddy current damping stage and LHe flow cryostat | © Scienta Omicron
VT SPM XA with with eddy current damping stage and LHe flow cryostat.
The VT SPM XA with zoom in to the eddy current damping stage, LHe cold finger and sample reception stage.  | © Scienta Omicron
The VT SPM XA with zoom in to the eddy current damping stage, LHe cold finger and sample reception stage.

VT SPM

Outstanding SPM performance with maximum flexibility.

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  • Reliable & robust SPM solution.
  • Variable Temperature operation ranging from 50 K to 650 K.
  • True pA STM and dI/dV Spectroscopy.
  • Beam Deflection AFM and QPlus AFM.
  • A truly versatile SPM.

The Scienta Omicron VT SPM is the most commonly used workhorse SPM for room- and variable temperature applications. More than 500 instruments have been delivered and successfully installed around the world. The volume of research results including several thousand referenced publications is a conclusive proof for the performance, quality, and versatility of the Variable Temperature SPM design.

VT STM XA and VT AFM XA offer the full range of STM and AFM techniques under UHV conditions:

  • QPlusTM and beam deflection AFM
  • Kelvin probe microscopy
  • Magnetic force microscopy
  • Hydrogen de-passivation lithography

and many more. The VT SPM XA ensures high stability SPM work in a stand-alone UHV environment while various adaptations are available to interface the VT SPM Lab to larger UHV system clusters. 

More Information

Easy UHV System Integration

Technical drawing of the VT with its own chamber (red) mounted to a MULTIPROBE system. | © Scienta Omicron
The VT with its own chamber (red) mounted to a MULTIPROBE system.

VT instruments are housed in their own, dedicated UHV chamber which can either be mounted onto a standard Scienta Omicron system (MULTIPROBE…) or “bolted-on” to an existing vacuum system. In this case the wobble stick enables the sample transfer from the main vacuum system to the VT instrument. Instead of directly mounting the bolt-on SPM chamber to an existing system, Omicron also offers specifically designed small sub-systems. These operate as stand-alone systems and can be connected via a sample transfer mechanism to any existing system.

Technical drawing of the SPM Subsystem | © Scienta Omicron
SPM Sub-system: Instead of directly mounting the bolt-on SPM chamber to an existing system, Scienta Omicron also offers specifically designed small sub-systems. These operate as stand-alone systems and can be connected via a sample transfer to any existing system.

STM

STM Tip in VT Tip Holder  | © Scienta Omicron
STM tip in VT tip holder.

The VT STM utilizes a scanned tip design with a single tube scanner which has a scan range (xyz) of 12 μm × 12μm × 1.5 μm. The tips are exchangeable in-situ. The first I/V conversion stage is located in-situ, close to the scanner in order to achieve the best signal-to-noise ratio and optimal performance. The scanner is mounted on an independent, orthogonal, and guided 3D coarse positioning device with 10 mm × 10 mm × 10 mm travel in xyz direction comment. An upgrade to QPlus® AFM is available.

STM Image Example  | © Scienta Omicron
STM image (30 x30 nm2, VS=2.7 V, It=0.015 nA) of C60 molecules adsorbed onto nanopores of a TBB molecular network with an atomic resolution of the SiB(111) substrate and submolecular resolution of the organic network and C60 . The image shows the C60–TBB–SiB(111) interface for a very low C60 coverage (below 0.1 monolayer (ML)). No protrusion is observed on the SiB(111) substrate and over the TBB molecules. Data courtesy of F. Palmino Literature: Angew. Chem. Int. Ed. 2011, 50, 4094 –4098

Beam deflection AFM Technology

Diagram of the working principle of beam deflection AFM | © Scienta Omicron
Working principle of beam deflection AFM: The optical detection is integrated in the scanner tube to give best performance for sample cooling or heating. All optical alignments are performed using remote-controlled piezo inertia drives.

The AFM Technology of the Variable Temperature SPM is based on more than 20 years of experience in Atomic Force Microscopy in UHV. It has been continuously developed and improved. The classic Beam Deflection AFM for contact and non-contact AFM offers the flexibility for many operational modes and different cantilever types. For example, high resolution AFM, Friction Force Microscopy, Electrostatic Force Microscopy (EFM), Scanning Kelvin Probe Microscopy (SKPM) and Magnetic Force Microscopy (MFM) are available.

The latest major development is a new AFM preamplifier which increases the detection bandwidth from 450 kHz to 2 MHz. In combination with the new AFM electronics (PLL) of the MATRIX Control System, users can now use high resonant frequency cantilevers for high speed non-contact AFM measurements.

This preamplifier technology in combination with an improved light source is also available as an upgrade package for existing Variable Temperature AFM’s. Please contact your local sales representative or our service support team (service@omicron.de) if you are interested in upgrading your system.

The “QPlus®” sensor, based on a tuning fork design, is today extending the possible application range of the Variable Temperature SPM.

Cantilever mounted on an exchangeable tip carrier | © Scienta Omicron
Cantilever mounted on an exchangeable tip carrier.
High speed non-contact AFM on oxidised Sb crystals on HOPG | © Scienta Omicron
High speed non-contact AFM on oxidised Sb crystals on HOPG. Scan range 2000nm x 2000nm, 200points x 200lines, tip speed: 20 000nm/s Sample courtesy of Dr. B. Kaiser, TU Darmstadt, Germany.

‘QPlus Sensor’ AFM (Optional)

QPlus sensor mounted on an exchangeable tip carrier | © Scienta Omicron
QPlus® sensor mounted on an exchangeable tip carrier.

The ‘QPlus® sensor’ is based on a quartz tuning fork and a new approach for non-contact atomic force microscopy. Due to the stiffness of the QPlus® sensor (spring constant ~ 1800 N/m), it can be operated with smaller oscillation amplitudes compared to conventional cantilevers. The sensor is also useful for AFM navigation of an STM tip and subsequent STM imaging and spectroscopy. Due to the stiffness and the use of solid metal tips, stable STM operation can be achieved using the QPlus® sensor. The QPlus® sensor is therefore ideal for the inclusion in STM‘s, and also as a complementary sensor for beam deflection instruments.

Sample and Tip Transfer

Technical drawing of the VT SPM Sample plate in transfer rod | © Scienta Omicron
Sample plate in transfer rod.

An easy-to-use, pincer-grip wobble stick is used for the fast transfer between the main system manipulator, the sample/tip storage carousel, and the sample acceptor stage in the UHV SPM. The transfer rod is employed to transport samples and tips to and from the fast sample entry chamber or the preparation chamber.

Technical drawing of the VT SPM sample plate in rotated manipulator - ready for pick up with wobble stick. | © Scienta Omicron
Sample plate in rotated manipulator - ready for pick up with wobble stick.
Technical drawing of the VT SPM Sample plate in SPM - ready for measurement | © Scienta Omicron
Sample plate in SPM - ready for measurement.

Optical Access

Sketch of the VT bolt on chamber.  | © Scienta Omicron
Sketch of the VT bolt on chamber. For details, please contact OMICRON.

The Variable Temperature SPM chamber offers 4 ports with a direct view to the sample. They can be used for mounting evaporators, a CCD camera or for optical experiments with lasers or photon detection.

Reference systems

Lab-10 Multi Compact System | © Scienta Omicron
142415

Lab10 Multi Compact System with VT SPM

The main research interests are the epitaxy growth of oxide films and heterojunctions, the construction of domain walls and phase boundaries in low-dimensional structures, and the exploration of novel physical and chemical properties of oxide surfaces and interfaces.

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Multiprobe Compact VT SPM 100 | © Scienta Omicron
161204

Multiprobe Compact VT SPM 100

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Scienta Omicron's Linear Transfer Line at the School of Materials Science & Engineering, Tsinghua University | © Scienta Omicron
163307

Materials Innovation Platform (MIP) with MBE, NanoScan Lab, VT AFM and ARPES Lab

Research focuses on Magnetic Films and Spintronics, including antiferromagnet spintronics and multi-field control of magnetism.

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VT AFM | © Scienta Omicron
163805

VT SPM Lab

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The VT SPM Lab, Lab 10 MBE,  MIP, and VT Systems at School of Physical Science and Technology, Shanghai Tech University | © Scienta Omicron
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Compact Materials Innovation Platform (MIP) with Lab10 MBE and VT SPM Lab

Materials Innovation Platform (MIP) to investigate novel materials such as monolayer transition metal dichalcogenides (TMDC).

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LT STM  | © Scienta Omicron
64607

LT STM Lab Combined with VT AFM

The MULTIPROBE LT XP system with an extension for a VT AFM XA. The LT STM features QPlus AFM operation. The preparation chamber is equipped for sputtering, thin film growth and tip preparation (electron beam heating).

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Customised Low-Temperature System Solutions | © Scienta Omicron
65010

Customised LT STM Lab with VT AFM, XPS, AES, an ISS

In this system the MULTIPROBE XP is combined with a versatile analysis chamber. A central sample distribution chamber connects both of the system modules.

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Materials Innovation Platform (MIP) with MBE and Surface Analysis
74504

Materials Innovation Platform (MIP) with MBE and Surface Analysis

Institute for Integrative Nanosciences (IIN) research activities cover flexible and printable magneto-electronic devices, self-propelled nanotools, strain-tunable single photon devices, ultra-compact self-wound batteries, as well as binary GaAs, AlAs, InAs layers, ternary InGaAs & AlGaAs compounds and self-assembled InAs and GaAs quantum dots.

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Downloads

VT XA Series: Variable Temperature UHV SPM

3.84 MB

The VT XA design forms a new series of VT instruments using standard Scienta Omicron samples plates. The philosophy of the XA series is to provide maximum compatibility with many different surface science techniques, like MBE, RHEED and different kinds of electron spectroscopy.

MULTIPROBE: Multi-Technique UHV Surface Science Systems

4.61 MB

The modular and compact design of the MULTIPROBE systems has proven itself more than 1000-times and forms the core module for multi-technique Ultra-High-Vacuum (UHV) applications. A typical comprehensive MULTIPROBE system combines UHV SPM (at variable or dedicated low temperatures) and electron spectroscopy techniques (Mono-XPS, UPS, AES/SAM, etc.) with thin film growth facilities (MBE, PLD, Sputtering, etc.). Our strength is to combine a wide range of techniques in a single UHV system - with uncompromised performance.

QSpeed: Simplifying QPlus AFM

1.46 MB

The new QSpeedTM AFM mode paves the way for stable and high speed QPlus® imaging with large scan ranges and high corrugations. QSpeed is based on the Tuned Oscillator AFM technique which has recently been advanced by Udo Schwarz's group at Yale University through which fit is licenced.

ZyVector: STM Control System for Lithography

2.59 MB

Scienta Omicron and Zyvex Labs announce a collaboration to develop and distribute tools for research and manufacturing that require atomic precision. The ZyVector STM Control System from Zyvex Labs turns a Scienta Omicron STM into an atomically-precise scanned probe lithography tool, and will be distributed world-wide by Scienta Omicron.

Zyvector Booklet

3.64 MB

Zyvex Labs pursues research and develops tools for creating quantum computers and other transformational systems that require atomic precision, towards its eventual goal of Atomically Precise Manufacturing. As part of this effort, ZyVector turns the world-class Scienta Omicron VT-STM into an STM lithography tool, creating the only complete commercial solution for atomic precision lithography.

Zyvex CHC Controller

2.78 MB

Scienta Omicron and Zyvex Labs announce a new leap forward in STM design; real- time position correction. The ZyVector STM control system from Zyvex Labs uses live position correction to enable atomic-precision STM lithography. Now the same live position correction technology is brought to the Matrix STM control system for microscopy and spectroscopy users, enabling fast settling times after large movements in x, y and z, and precise motion across the surface, landing and remaining at the desired location.

Services & Spare-parts

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