The flange mounted Tip Preparation Tool is designed for efficient cleaning of SPM tunneling tips. Especially etching remains or oxides can create artefacts or unstable tips during imaging or spectroscopy applications. The Tip Preparation Tool offers heating up to temperatures above 1000 °C at the tip to remove those remains.
Tool for STM Experiments
STM experts utilise this tool to prepare their tips for advanced STM experiments. Clean prepared tips allow for extremely reproducible results as e.g. required for dI/dV mapping.
The Tip Preparation Tool for all standard Scienta Omicron STM tips.
Safe handling by means of tip carrier plates and wobble stick. A z-shift allows optimising the distance between tip and the heating facility which allows to operate the tool for short and very long STM tips.
Accurate dI/dV mapping allows to distinguish between hcp and fcc domains on a Au(111) on Micoa surface. The displayed dI/dV map recorded close to the energy of max. difference in LDOS between hcp and fcc domains at -0.48eV. As a result almost no depression in dI/dV is seen at the hcp domain locations. Sub-surface defects (markers) contribute strongly to the dI/dV contrast.
Prior to the tip preparation process the same tip did not provide reliable tunneling conditions on the same sample surface.
For Scienta Omicron Tip Carrier Plates
Up to 1000 V
Up to 3 mA
Tunsten, Niobium, etc
> 1000 °C
Emission current monitor
DN 40 CF / 2¾′′ OD
For full specifications and more information about product options, please do not hesitate to contact your local sales representative.