MATRIX SPM Controller  | © Scienta Omicron
MATRIX 4
MATRIX SPM Images  | © Scienta Omicron
MATRIX is a versatile & high-performance SPM controller allowing for a large variety of experiments.

MATRIX SPM Control

Modular Hardware and Software Concept

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  • New high-performance AFM PLL for advanced QPlus® AFM
  • TipGuard and PLL Guide
  • Fast operating QPlus® AFM at low- and room-temperatures
  • Integrated Lock-In
  • New compact design

The MATRIX 4 Control System builds on 30 years of experience in SPM technology and unlocks the full capacity of our leading-edge Scanning Probe Microscopes. The key features include intuitive and flexible experiment control; best-in-class noise floor; ultimate QPlus® capability; full 64-bit software; and modular upgrade paths.

The MATRIX 4 Control System builds on 30 years of experience in SPM technology and unlocks the full capacity of our leading-edge Scanning Probe Microscopes. The MATRIX architecture couples advances in high-speed, low-noise digital electronics with the requirements of the latest SPM applications to offer the user an unprecedented level of signal quality, measurement speed, and experimental flexibility. The expandable design provides solutions for future challenges in Scanning Probe Microscopy.

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AFM PLL

MATRIX 4 includes advanced AFM PLL hardware, developed through a strategic partnership with the industry leader, Zurich Instruments. The new MATRIX 4 software interface offers all standard types of AFM measurements as well the flexibility to program custom control. There is a beginner mode for reliable and safe measurements, requiring minimum effort to initiate. Users can directly switch to an expert mode giving access to the complete parameter space of an AFM PLL with 4 digital, freely configurable demodulators. Preset options in MATRIX 4 for AFM perform high quality, high resolution AFM (either beam deflection or QPlus®) with easy switching to other modes like Kelvin Probe Force Microscopy (KPFM) or spectroscopy with a few mouse clicks.

PLL Guide Advanced Oscillation Control

MATRIX 4 includes the capability for various levels of control in setting up the oscillation of probes (cantilever/QPlus® sensors). The fully automated process uses software which follows an integral routine for finding the resonance frequency to set overall parameters, providing reliable and safe measurements. Advanced users can tailor this process at every step by setting the target bandwidth for amplitude or PLL control, and optimize the ratio of speed and signal-to-noise. If needed, full access to all regulation parameters is possible.

Tip Guard

Image of the NaCl(001): Constant Df imaging at small amplitudes. | © Scienta Omicron
NaCl(001): Constant Df imaging at small amplitudes. Constant Df topography imaged with defect or adsorbate on NaCl Ultra stable imaging down to very small oscillation amplitudes. Parameters: fres=27kHz, Q = 55k, Tip Guard on.

Advanced Tip protection to ensure tips are protected from unwanted crashes, the new MATRIX 4 hard- and software allows for triggering of a defined tip retraction depending on phase, amplitude, damping or arbitrary signals in a weighted mixture. For special applications, this function can also be modified. The fast tip protection-on minimises the risk of unwanted modification or destruction of the probe. This leads directly to continuous, stable high performance AFM measurements.

Screenshot of the PLL Basic Guide Window  | © Scienta Omicron
MATRIX 4 - PLL Basic Guide Window.
Screenshot of the PLL Expert Guide Window  | © Scienta Omicron
MATRIX 4 - PLL Expert Guide Window.
AFM PLL powered by Zurich Instruments  | © Scienta Omicron
AFM PLL powered by Zurich Instruments.

QSpeedTM AFM

Diagram of the QSpeedTM concept  | © Scienta Omicron
Concept of the QSpeedTM feedback loop (tuned oscillator) using a single feedback loop with lock-in amplifier measuring amplitude and phase.

The new QSpeedTM AFM mode paves the way for stable and high speed QPlus® (1) imaging with large scan ranges and high corrugations. QSpeedTM is based on the Tuned Oscillator AFM technique which has recently been advanced by Udo Schwarz's group at Yale University through which it is licenced (2).

The method overcomes limitations of conventional frequency modulated QPlus® AFM with slow scan speeds, where single survey images on the scale of 100 nanometers can take many hours. In addition, the high probability of tip crashes on largely corrugated, contaminated or charged samples is dramatically reduced and therefore allows using QPlus® AFM technology in a much broader field of applications and with maximum simplicity for less experienced users.

The first results using QSpeedTM with MATRIX 4 show undisturbed images at surprisingly high scan speed of up to 5 µm per second in a VT AFM operated at room temperature in Scienta Omicron´s R&D lab. Although the Si(111) surface was contaminated with weakly bound clusters of several nanometres size, scans were completed with no major tip modification or tip crash. The QSpeedTM AFM mode will be available for all MATRIX 4 controllers using Scienta Omicron's new Zurich Instruments powered PLL AFM controller.

(1) F.-J. Giessibl, Science, 1995, 267(5194): 68-71

(2) Tuned-Oscillator Atomic Force Microscopy, licenced from Yale University, O.E. Dagdeviren et al., Nanotechnology 27 (2016) 065703, patent pending.

Graph and images of the of the QPlus AFM survey  | © Scienta Omicron
QPlus AFM survey scan on contaminated Si(111) using QSpeedTM with a scan range of 1 x 1 um and scan speed of 1um/s. The measurement was taken with a VT SPM operated at room temperature. The scan was recorded within only 13 minutes and shows excellent imaging stability at high imaging speed. (Z) Z-signal with line profile showing a corrugation of approx. 4 nm. (A) Amplitude signal. (Φ)Phase signal.

TWIN Regulator

TWIN Regulator Software Screenshot  | © Scienta Omicron
TWIN Regulator user interface for STM and non-contact AFM.

Instead of mixing or switching input signals, the TWIN Regulator has two independent complete feedback loops, allowing for separate but simultaneous optimisation of the two regulation signals. Therefore the TWIN Regulator dramatically improves the efficiency of research work by enabling a seamless transition between modes. The TWIN Regulator also opens up chances for unique experiments by combining or mixing different feedback signals.

Screenshot of the Digital TWIN Regulator Software  | © Scienta Omicron
No caption (?)

Tunneling and Force Spectroscopy

MATRIX Control System Software | © Scienta Omicron
The window provides optional settings for feedback loop, status signals and switches for modulation spectroscopy.

The MATRIX Control System realises a n-dimensional concept for data acquisition and data handling and is therefore the ideal platform for tunneling and force spectroscopy. The spectroscopy control window provides a quick method of viewing and setting parameters such as start and end values, number of points, grid settings, slew rates, delay times and the spectroscopy mode. It also provides activation of ramp reversal and repetitions (multiple curve measurement). The MATRIX Automated Task Environment (MATE) allows the user to modify the standard set up for custom experiments.

MATRIX Control System Software  | © Scienta Omicron
The window provides optional settings for feedback loop, status signals and switches for modulation spectroscopy.
A) Topography image of NaCl(001). B) df(z) curves | © Scienta Omicron
A) Topography image of NaCl(001). B) df(z) curves
QPlus display output of NaCl(001): force distance curve at small amplitudes.  Parameters: fres=27kHz, Q = 55k | © Scienta Omicron
NaCl(001): force distance curve at small amplitudes.  Parameters: fres=27kHz, Q = 55k

Beam Deflection AFM Control

MATRIX AFM Control Board  | © Scienta Omicron
MATRIX AFM control board.

The AFM controller (including QPlus) with digital PLL is an integral solution for the MATRIX control system and a perfect match with Scienta Omicron's Scanning Probe Microscopes. It increases flexibility and improves usability. It offers an integrated regulator for Scanning Kelvin Probe Experiments. The superior signal-to-noise characteristic is proven by experiments.

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Downloads

MATRIX 4: The SPM Controller Evolution

913.86 KB

The MATRIX 4 Control System builds on 30 years of experience in SPM technology and unlocks the full capacity of our leading-edge Scanning Probe Microscopes. The key features include 1) intuitive and flexible experiment control; 2) best-in-class noise floor; 3) ultimate QPlus capability; 4) full 64-bit software; and 5) modular upgrade paths.

MATRIX 4: Beam Deflection AFM Option

1.39 MB

The Scienta Omicron MATRIX 4 Beam Deflection and Plus AFM Control System with digital PLL is an integral solution for the MATRIX control system and a perfect match with the Scienta Omicron SPMs. Includes sensor alignment & control, light source control, resonance/phase curve acquisition, amplitude channel, automatic phase adjustment and more. Processor board with an integrated Kelvin regulator.

QSpeed: Simplifying QPlus AFM

1.46 MB

The new QSpeedTM AFM mode paves the way for stable and high speed QPlus® imaging with large scan ranges and high corrugations. QSpeed is based on the Tuned Oscillator AFM technique which has recently been advanced by Udo Schwarz's group at Yale University through which fit is licenced.

ZyVector: STM Control System for Lithography

2.59 MB

Scienta Omicron and Zyvex Labs announce a collaboration to develop and distribute tools for research and manufacturing that require atomic precision. The ZyVector STM Control System from Zyvex Labs turns a Scienta Omicron STM into an atomically-precise scanned probe lithography tool, and will be distributed world-wide by Scienta Omicron.

Zyvector Booklet

3.64 MB

Zyvex Labs pursues research and develops tools for creating quantum computers and other transformational systems that require atomic precision, towards its eventual goal of Atomically Precise Manufacturing. As part of this effort, ZyVector turns the world-class Scienta Omicron VT-STM into an STM lithography tool, creating the only complete commercial solution for atomic precision lithography.

Zyvex CHC Controller

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Scienta Omicron and Zyvex Labs announce a new leap forward in STM design; real- time position correction. The ZyVector STM control system from Zyvex Labs uses live position correction to enable atomic-precision STM lithography. Now the same live position correction technology is brought to the Matrix STM control system for microscopy and spectroscopy users, enabling fast settling times after large movements in x, y and z, and precise motion across the surface, landing and remaining at the desired location.