PEEM, LEED, & RHEED

More than 25 years of experience in electron diffraction, spectroscopy and microscopy enables Scienta Omicron to offer a variety of dedicated PEEM, LEED and RHEED instruments along with supporting software for excellent performance and reliability. 

Find the component for your application below and contact us for detailed information.

PEEM

Photoemission Electron Microscopy (PEEM) is an extremely powerful imaging technique, whose versatility for topographical, chemical and magnetic contrast imaging at high resolution has been demonstrated in many laboratory and synchrotron applications.

LEED 450

The LEED 450 with integral shutter has LEED and AES capabilities using a miniature electron gun, set of concentric grids and a conductive, phosphor coated screen. It is an extremely reliable high-performance LEED instrument which operates with up to date digital power supply.

LEED 600

The LEED 600 with integral shutter has LEED and AES capabilities using a miniature electron gun, set of concentric grids and a conductive, phosphor coated screen. It is an extremely reliable high-performance LEED instrument which operates with up to date digital power supply.

LEED 600 MCP

The LEED 600 MCP has LEED and AES capabilities using a miniature electron gun, set of concentric grids and a conductive, phosphor coated screen. In addition, this optic model incorporates the high gain of microchannel plates.

LEED 800

The LEED 800 with integral shutter has LEED and AES capabilities using a miniature electron gun, set of concentric grids and a conductive, phosphor coated screen. It is an extremely reliable high-performance LEED instrument which operates with up to date digital power supply.

LEED 800 MCP

The LEED 800 MCP with integral shutter has LEED and AES capabilities using a miniature electron gun, set of concentric grids and a conductive, phosphor coated screen. In addition, this optic model incorporates the high gain of microchannel plates.

RHEED 15 kV

The RHEED 15 kV Reflection High-Energy Electron Diffraction is an in-situ characterisation tool, often used in Molecular Beam Epitaxy (MBE) systems.

RHEED 20 kV

The RHEED 20 kV Reflection High-Energy Electron Diffraction is an in-situ characterisation tool, often used in Molecular Beam Epitaxy (MBE) systems.

RHEED 30 kV

The RHEED 30 kV Reflection High-Energy Electron Diffraction is an in-situ characterisation tool, often used in Molecular Beam Epitaxy (MBE) systems.