PEEM LEED RHEED

More than 25 years of experience in electron diffraction enables Scienta Omicron to offer a variety of dedicated PEEM, LEED and RHEED instruments along with supporting software for excellent performance and reliability. 

Find the component for your application below and contact us for detailed information.

PEEM

Photoemission Electron Microscopy (PEEM) is an extremely powerful imaging technique, whose versatility for topographical, chemical and magnetic contrast imaging at high resolution has been demonstrated in many laboratory and synchrotron applications.

LEED 450

The LEED 450 with integral shutter has LEED and AES capabilities using a miniature electron gun, set of concentric grids and a conductive, phosphor coated screen. It is an extremely reliable high-performance LEED instrument which operates with up to date digital power supply.

LEED 600

The LEED 600 with integral shutter has LEED and AES capabilities using a miniature electron gun, set of concentric grids and a conductive, phosphor coated screen. It is an extremely reliable high-performance LEED instrument which operates with up to date digital power supply.

LEED 600 MCP

The LEED 600 MCP has LEED and AES capabilities using a miniature electron gun, set of concentric grids and a conductive, phosphor coated screen. In addition, this optic model incorporates the high gain of microchannel plates.

LEED 800

The LEED 800 with integral shutter has LEED and AES capabilities using a miniature electron gun, set of concentric grids and a conductive, phosphor coated screen. It is an extremely reliable high-performance LEED instrument which operates with up to date digital power supply.

LEED 800 MCP

The LEED 800 MCP with integral shutter has LEED and AES capabilities using a miniature electron gun, set of concentric grids and a conductive, phosphor coated screen. In addition, this optic model incorporates the high gain of microchannel plates.

FemtoLEED DLD L800

The Femto-LEED with integral shutter enables nano-scale measurements of surface periodic structures with a femto-ampere electron probe. Instead of a fluorescent screen, it uses a delay line detector and allows for fully digital operation.

FemtoLEED DLD L1000

The LEED DLD L1000 with integral shutter enables measurements of ultra-sensitive and insulating films. Instead of a fluorescent screen, it uses a delay line detector which allows for fully digital operation. The hex-anode provides minimised blind area due to the redundant detection opportunities of the added third delay line layer.

LEED Lab Base

LEED Lab Base is a software package to simulate (free version) and quantitatively analyse (only full version) LEED patterns. The full version (licence for LEEDLab__Base required) has been developed to enable geometric simulations of complex surface structures, allowing objective determination of the lattice parameters and/or epitaxial relations.

RHEED 15 kV

The RHEED 15 kV Reflection High-Energy Electron Diffraction is an in-situ characterisation tool, often used in Molecular Beam Epitaxy (MBE) systems.

RHEED 20 kV

The RHEED 20 kV Reflection High-Energy Electron Diffraction is an in-situ characterisation tool, often used in Molecular Beam Epitaxy (MBE) systems.

RHEED 30 kV

The RHEED 30 kV Reflection High-Energy Electron Diffraction is an in-situ characterisation tool, often used in Molecular Beam Epitaxy (MBE) systems.