The HIS 13 is a flange mounted and easy to integrate vacuum ultraviolet photon source for standard and advanced photoelectron spectroscopy applications.
The excellent performance, ease-of-operation and it´s robust design makes the HIS 13 VUV light source an excellent choice for ultraviolet photoelectron spectroscopy.
The operation of the lamp is based on a cold cathode capillary discharge. There is a windowless direct sight connection between the discharge area and the target. The discharge current is electronically stabilised.
The lamp is water cooled in order to allow for high discharge currents (up to 300 mA) and optimum uptime.
The HIS 13 can be operated with various discharge gases, such as helium, neon, argon, krypton, xenon or hydrogen. In many applications it is operated with helium in the He I mode delivering a very narrow (1...3 meV) emission line at 21.2 eV (584 nm) that is commonly used for standard UPS.
A choice of light capillaries and an optional 3rd pumping stage allows configuring the source according to the experimental requirements (photon flux vs. operating pressure etc.)
An integral portaligner faciliates the positioning of the light spot on the sample in a range of ± 3°.
> 80 nA (biased AI foil)
He I, He II, Ne II, Ar I, Ar II, Kr I, Kr II, Xe I, Xe II, H (Lyα, Lyβ)
Selectable length & diameter
Up to 300 W
Down to 10-10 mbar (He I)
Two or three (optional) stage
DN 40 CF 2¾″ OD
Via backside viewport
± 3° port aligner
Up to 250 °C
For full specifications and more information about product options, please do not hesitate to contact your local sales representative.
NanoESCA for Momentum Microscopy and XPS System
Investigation of :
- Ferroelectrica, (BaTiO3, BiFeO3)
- Resistive oxide memories (post – CMOS technology)
- Graphene on SiC
Materials Innovation Platform (MIP) for Novel Quantum Materials
Materials Innovation Platform (MIP) to enable research on the combination of different material classes for the development of novel quantum materials.more
HAXPES Lab combined with XPS Lab
HAXPES provides unique characterisation of a wide range of materials systems including:
- Buried interfaces, such as active electronic layers below a surface capping layer
- Depth-profiling through heterostructures and e.g. layered low-dimension materials
- Probing of dopants and contaminants in the bulk of a material
- Many interfaces such as thin films on a substrate
MULTIPROBE System with XPS, UPS, and Large Sample SPM
Research focus on the relation between electronic properties and device performances of Dirac electrons and two-dimensional electron systems such as graphene and GaN and controlling the surface structural and electronic properties of graphene in terms of the crystallographic orientation of the Si substrate.more
LT STM Lab with R3000 for ARPES
MULTIPROBE LT XA platform in Nottingham, GB, delivers High-Performance STM/AFM (QPlus) and High-Resolution UPS/ARPES results.more
LT STM Lab with QPlus AFM, ARPES and MBE
Combined low-temperature (T < 5K) Scanning Tunneling Microscope (LT-STM/AFM) with ARPES and Molecular Beam Epitaxy (MBE) system, incorporating in-situ electronic transport measurements, optical access, and crystal growth capability.more