The DSX400 provides high flux X-ray radiation which enables intense photoelectron spectra. The dual anode makes it possible to change excitation energy without breaking vacuum and thus quickly verify measured data. The X-ray tube is designed with a narrow nose cone which ensures a short source-to-sample distance, also when combined with other techniques.
In the pursuit for great research results, DSX400 is a reliable addition to your analyser. It provides high flux magnesium and aluminum X-ray radiation without the need to vent the system when switching in between. The excellent life time makes sure that your hours are spent on research instead of service work.
A user-friendly GUI allows easy access to all parameters and the control electronics includes interlocks and auto-start-up procedures for safe and simple operation.
The standard DSX400 is equipped with an aluminum and a magnesium anode but other anode materials are available on request. High thermal conductivity of the anode and optimised water flow ensures efficient cooling. A thin aluminum window reduces Bremsstrahlung radiation and acts as a partial vacuum barrier enabling differential pumping of the X-ray source. The filaments are made of durable yttria-coated tungsten to ensure long lifetimes, even for high emission use.
The outer design provides high flexibility when mounted on a UHV system. For minimum working distance and multi-technique integration a 100 mm linear drive can be added.
A linear drive (100 mm) can be added to enable minimum working distance and multi-technique integration. If differential pumping is required there is an option to include an additional port (NW 16 CF) for this. Alternative anode materials, such as titanium and silver, are available on request.
Mg (1253.6 eV, 0.989 nm) and Al (1486.7 eV, 0.834 nm)
Ti, Zr, Ag, Au, Y and more
300 W for Mg-anode. 400 W for Al-anode
For full specifications and more information about product options, please do not hesitate to contact your local sales representative.
< 0.35 %
NW 40 CF, fixed
HAXPES Lab combined with XPS Lab
HAXPES provides unique characterisation of a wide range of materials systems including:
- Buried interfaces, such as active electronic layers below a surface capping layer
- Depth-profiling through heterostructures and e.g. layered low-dimension materials
- Probing of dopants and contaminants in the bulk of a material
- Many interfaces such as thin films on a substrate