DA30-L-8000 Angular Resolved Hemispherical Electron Analyser  | © Scienta Omicron
The DA30-L-8000 angular resolved hemispherical analyser with deflector concept.


Highest Performance at the Lowest Kinetic Energies


  • 30° full cone acceptance without sample rotation
  • Spin-resolved MDC without sample rotation
  • Matrix element effects are avoided by keeping sample fixed
  • Ensures same spot for all k//
  • Improved ky accuracy (resolution better than 0.1°)
  • Patented (WO2013/133739)
  • Fast electronic deflection

The DA30-L-8000 analyser is a progression of the DA30-L analyser optimised for ultra-high resolution at low kinetic energies. Combined with Scienta Omicron´s deflector concept electronic band structure mapping of the full surface Brillouin zone without changing measurement geometry is possible. These are the models of choice for ARPES measurements below 3 eV kinetic energy with high demands for energy resolution.

The DA30-L-8000 is not a serial production analyser but tailored to the particular experiment of each customer. To ensure best possible performance of the analyser a number of important processes have been optimised.

The high voltage electronics design has been optimised for high energy resolution using ultra stable HV-supplies. Each HV-supply is checked individually for low noise and long-term stability. Special attention is paid to common grounding of all analyser parts to the HV-electronics.

Critical dimensions of analyser parts are trimmed manually to reach the design criteria. Special care is taken to the mu-metal connections inside the analyser and the analyser is demagnetised at customer site.

The analyser is supplied with a customised slit set and lens table for 0.5 eV pass energy enabling ultra-high resolution measurements.

More Information

Deflection Advantage

The deflection feature is a big advantage as it allows to keep the sample in a fixed position and instead uses the deflectors to change the angular range in θy projected on to the analyser slit. This ensures the same position of the sample is probed during the whole measurement. In addition, keeping the experimental geometry fixed throughout the measurement sequence avoids matrix element effects which are caused by variations in ionisation cross section for different photon to sample angles. This allows to acquire higher quality data using the faster and more precise electronic deflection compared with mechanical sample movement. Another advantage, for some samples, is that decreased rotation requirements allow manipulators with fewer degrees of freedom to be used. This ultimately allows for lower sample temperatures to be reached.

DA30-L-8000 UPS Upgrade

This item extends the kinetic energy range of the DA30-L-8000 up to 100 eV. The required additional high voltage cards will be housed in the DA30-L-8000 HV-rack. When using the UPS upgrade HV configuration the DA30-L-8000 will have DA30-L performance in terms of energy resolution.

HV-rack Addition

An XPS energy range upgrade is possible by adding a second high voltage electronics rack. The separate HV-rack will extend the energy range up to 1500 eV kinetic energy with DA30-L performance.


Energy resolution

< 1.0 meV FWHM

Transmission mode energy range

0.5 eV – 12 eV *

Angular modes

± 3.5°, ± 7°, ± 15°

Angular mode energy range

0.5 eV – 12 eV *

* The energy range can be extended to 100 eV with the available UPS upgrade.

For full specifications and more information about product options, please do not hesitate to contact your local sales representative.


Deflection mode energy range

0.5 eV – 12 eV *

Deflection mode Spin scan


Operating pressure

< 10-5 mbar

Mounting flange

NW 200 CF


A Time- and Angle-Resolved Photoemission Spectroscopy with Probe Photon Energy up to 6.7 eV

A Time- and Angle-Resolved Photoemission Spectroscopy with Probe Photon Energy up to 6.7 eV


In this Review, Prof. Wentao Zhang et al. introduce the development of an advanced trARPES system with probe photon energy up to 6.7 eV. The system is based on a Yb-based laser, KBe2BO3F2 (KBBF) and BBO nonlinear optical crystals,...

A Time- and Angle-Resolved Photoemission Spectroscopy with Probe Photon Energy up to 6.7 eV


We present the development of a time- and angle-resolved photoemission spectroscopy based on a Yb-based femtosecond laser and a hemispherical electron analyzer. The energy of the pump photon is tunable between 1.4 and 1.9 eV, and...

Functions to Map Photoelectron Distributions in a Variety of Setups in Angle-Resolved Photoemission Spectroscopy


The distribution of photoelectrons acquired in angle-resolved photoemission spectroscopy can be mapped onto the energy-momentum space of the Bloch electrons in the crystal. The explicit forms of the mapping function f depend on the...

Reference systems

Laser ARPES DA30-L-(R) 8000 | © Scienta Omicron

ARPES Lab with Integrated Preparation Chamber

The state-of-the-art ARPES instrument to contribute in the research focusing on quantum materials. 

Molecular Beam Epitaxy (MBE) System and Angle-Resolved Photoemission Spectroscopy (ARPES) Cluster Tool for the Nanyang Technological University  | © Scienta Omicron

Cluster Tool for MBE and ARPES

Materials Innovation Platform (MIP) with ARPES and MBE modules for the growth and characterisation of topological insulator chalcogenide crystals.

Epitaxial Quantum Materials | © Scienta Omicron

Materials Innovation Platform (MIP) for Epitaxial Quantum Materials

Research focus on controlled synthesis of epitaxial thin films and nanostructures, including: ferroelectrics, strongly correlated oxides, multiferroics, superconductors, thermoelectrics, photovoltaics, oxide catalysts, electronic/ionic conductors, and the characterisation of their functional properties.